Atomic force microscopy (AFM) is a form of scanning probe microscopy that uses a probe to explore the surface of samples to visualize materials at the nano and atomic scales. Contact mode is a fundamental imaging technique in AFM and serves as the foundation for various derivative imaging modes. However, its performance has remained largely unchanged since the inception of AFM. Our recently released Vero AFM has revolutionized the AFM landscape by introducing a new era of contact mode imaging, offering unprecedented resolution and precise force control. Register for our next AFM webinar to learn how to get unparalleled results using Vero’s contact mode!
📅 Save the date: on 𝗝𝘂𝗹𝘆 𝟭𝟳 we're hosting our next webinar! Join this one to learn how the #VeroAFM's contact mode outperforms traditional contact mode, plus an overview of Vero and QPDI detection. 𝗥𝗲𝗴𝗶𝘀𝘁𝗲𝗿 👉 https://lnkd.in/gbWz__9. #AFMwebinar #AtomicForceMicroscopy #2Dmaterials #Graphene